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Thickness measurement and flaw detection
Starrett-Bytewise

At this year’s expo, Starrett-Bytewise will introduce the new Calender Gauge+Flaw System (CG+F). This dual-purpose in-line system measures thickness and width, and performs flaw detection on gum calenders to help tire manufacturers ensure the highest quality. The CG+F measures the thickness of the bottom layer at the left and right edges; the combined thickness of left, center and right positions; the edge step-off width for the right and left edges; and the overall width of both layers. It does this using three laser sensor pairs that are positioned by a rack-and-pinion drive. Optionally, the CG+F frame can be configured with a sensor array that digitizes the top and bottom surfaces to detect surface flaws such as voids, blisters and wrinkles.

The data gathered by the CG+F can also be used to perform directional studies for cyclical gauge variation related to the mechanical conditions of the calender. This data can be acquired during normal operation, avoiding sample cutting or measurement. Finally, for ease of use, the CG+F is self-calibrating: sensor pairs are periodically moved to a calibration station, where they measure the calibration block. Depending on the results of this test, the offset is updated if necessary and the sensors return to the scanning position to resume operation.

www.bytewise.com
Booth 3038

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